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Determination of optical properties of titanium dioxide thin films on different substrates by using spectroscopic ellipsometry

著者名:
Kim, H.J. ( Korea Research Institute of Standards and Science (South Korea) )
Cho, Y.J. ( Korea Research Institute of Standards and Science (South Korea) )
Cho, H.M. ( Korea Research Institute of Standards and Science (South Korea) )
Chegal, W. ( Korea Research Institute of Standards and Science (South Korea) )
Lee, Y.W. ( Korea Research Institute of Standards and Science (South Korea) )
Kim, S.Y. ( Ajou Univ. (South Korea) )
さらに 1 件
掲載資料名:
Optical constants of materilas for UV to x-ray wavelengths : 4-5 August 2004, Denver, Colorado, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5538
発行年:
2004
開始ページ:
165
終了ページ:
171
総ページ数:
7
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454768 [0819454761]
言語:
英語
請求記号:
P63600/5538
資料種別:
国際会議録

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