Tomographic x-ray absorption spectroscopy
- 著者名:
Schroer, C.G. ( Aachen Univ. (Germany) and HASYLAB/Deutches Electronen-Synchrotron (Germany) ) Kuhlmann, M. ( Aachen Univ. (Germany) ) Gunzler, T.F. ( Aachen Univ. (Germany) ) Lengeler, B. ( Aachen Univ. (Germany) ) Richwin, M. ( Bergische Univ. Wuppertal (Germany) ) Griesebock, B. ( Bergische Univ. Wuppertal (Germany) ) Lutzenkirchen-Hecht, D. ( Bergische Univ. Wuppertal (Germany) ) Frahm, R. ( Bergische Univ. Wuppertal (Germany) ) Ziegler, E. ( European Synchrotron Radiation Facility (France) ) Mashayekhi, A. ( Argonne National Lab. (USA) ) Haeffner, D.R. ( Argonne National Lab. (USA) ) Grunwaldt, J.-D. ( ETH Honggerberg (Switzerland) ) Baiker, A. ( ETH Honggerberg (Switzerland) ) - 掲載資料名:
- Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5535
- 発行年:
- 2004
- 開始ページ:
- 715
- 終了ページ:
- 723
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819454737 [0819454737]
- 言語:
- 英語
- 請求記号:
- P63600/5535
- 資料種別:
- 国際会議録
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