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Study of short-term instabilities of InGaN/GaN Light-emitting diodes by means of capacitance-voltage measurements and deep-level transient spectroscopy

著者名:
Meneghesso, G. ( Univ. degli Studi di Padova (Italy) )
Meneghini, M. ( Univ. degli Studi di Padova (Italy) )
Levada, S. ( Univ. degli Studi di Padova (Italy) )
Zanoni, E. ( Univ. degli Studi di Padova (Italy) )
Cavallini, A. D. M. ( Univ. di Bologna (Italy) )
Castaldini, A. ( Univ. di Bologna (Italy) )
Hdrle, V. ( OSRAM Opto Semiconductors GmbH (Germany) )
Zahner, T. ( OSRAM Opto Semiconductors GmbH (Germany) )
Zehnder, U. ( OSRAM Opto Semiconductors GmbH (Germany) )
さらに 4 件
掲載資料名:
Fourth international conference on solid state lighting : 3-6 August 2004, Denver, Colorado, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5530
発行年:
2004
開始ページ:
251
終了ページ:
259
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0227786x
ISBN:
9780819454683 [0819454680]
言語:
英語
請求記号:
P63600/5530
資料種別:
国際会議録

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