Nanocrystal superlattice imaging by atomic force microscopy (Invited Paper)
- 著者名:
- Stoimenov, P.K. ( Kansas State Univ. (USA) )
- Stoeva, S.I. ( Kansas State Univ. (USA) )
- Prasad, B.L.V. ( Kansas State Univ. (USA) )
- Sorensen, C.M. ( Kansas State Univ. (USA) )
- Klabunde, K.J. ( Kansas State Univ. (USA) )
- 掲載資料名:
- Physical Chemistry of Interfaces and Nanomaterials III
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5513
- 発行年:
- 2004
- 開始ページ:
- 174
- 終了ページ:
- 184
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819454515 [0819454516]
- 言語:
- 英語
- 請求記号:
- P63600/5513
- 資料種別:
- 国際会議録
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4
国際会議録
Wavelet image processing for optical pattern recognition and feature extraction (Invited Paper)
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