Contact layer printing using alternating phase-shifting masks: mask making, patterning results, and production implementation
- 著者名:
Pforr, R. ( Infineon Technologies AG(Germany) ) Dettmann, W. ( Infineon Technologies AG(Germany) ) Eisenhut, M. ( Infineon Technologies AG(Germany) ) Hennig, M. ( Infineon Technologies AG(Germany) ) Hofmann, D. ( Infineon Technologies AG(Germany) ) Thiele, J. ( Infineon Technologies AG(Germany) ) Thielscher, G. ( Infineon Technologies AG(Germany) ) - 掲載資料名:
- 20th European Conference on Mask Technology for Integrated Circuits and Microcomponents
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5504
- 発行年:
- 2004
- 開始ページ:
- 178
- 終了ページ:
- 187
- 総ページ数:
- 10
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819454379 [0819454370]
- 言語:
- 英語
- 請求記号:
- P63600/5504
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
7
国際会議録
Qualification of alternating PSM: defect inspection analysis in comparison to wafer printing results
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |