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Impact of the back-gate bias on the low-frequency noise of partially depleted silicon-on-insulator MOSFETs

著者名:
Lukyanchikova, N. R. ( Institute of Semiconductor Physics (Ukraine) )
Garbar, N. ( Institute of Semiconductor Physics (Ukraine) )
Smolanka, A. ( Institute of Semiconductor Physics (Ukraine) )
Simoen, E. ( IMEC (Belgium) )
Mercha, A. ( IMEC (Belgium) )
Claeys, C. ( IMEC (Belgium) and Katholieke Univ. Leuven (Belgium) )
さらに 1 件
掲載資料名:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5470
発行年:
2004
開始ページ:
208
終了ページ:
214
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453969 [081945396X]
言語:
英語
請求記号:
P63600/5470
資料種別:
国際会議録

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