Impact of the back-gate bias on the low-frequency noise of partially depleted silicon-on-insulator MOSFETs

Impact of the back-gate bias on the low-frequency noise of partially depleted silicon-on-insulator MOSFETs

著者名:

Lukyanchikova, N. R. ( Institute of Semiconductor Physics (Ukraine) )

Garbar, N. ( Institute of Semiconductor Physics (Ukraine) )

Smolanka, A. ( Institute of Semiconductor Physics (Ukraine) )

Simoen, E. ( IMEC (Belgium) )

Mercha, A. ( IMEC (Belgium) )

Claeys, C. ( IMEC (Belgium) and Katholieke Univ. Leuven (Belgium) )

さらに 1 件

掲載資料名:

Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5470

発行年:

2004

開始ページ:

208

終了ページ:

214

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453969 [081945396X]

言語:

英語

請求記号:

P63600/5470

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014661
シリーズID:	PA00000029
会議名:	International Symposium on Fluctuations and Noise : Noise In Devices and Circuits
回次:	2004 : 2nd
会議開催地:	Maspalomas, Gran Canaria, Spain
会議開催年:	2004.05.26-2004.05.28

類似資料:

1 国際会議録 Back-gate induced noise overshoot in partially-depleted SOI MOSFETs Lukyanchikova, N., Garbar, N., Smolanka, A., Simoen, E., Claeys, C. Kluwer Academic Publishers	7 国際会議録 Influence of the Drain Bias and Gate Length of Partially Depleted SOI MOSFETs on the ZTC Biasing Point L.M. Camillo, J.A. Martino, E. Simoen, C. Claeys Electrochemical Society
2 国際会議録 Noise and Tunneling Through the 2.5 nm Gate Oxide in SOI MOSFETs Lukyanchikova, N., Simoen, E., Mercha, A., Claeys, C. Kluwer Academic Publishers	8 国際会議録 A Study on the Self-Heating Effect in Deep-Submicrometer Partially Depleted SOI MOSFETs at Low Temperatures Pavanello, M.A., Martino, J.A., Simoen, E., Mercha, A., Claeys, C., Dc Meyer, K. Electrochemical Society
3 国際会議録 Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs Simoen, E., Mercha, A., Claeys, C. Kluwer Academic Publishers	9 国際会議録 Noise Diagnostics for Advanced Silicon Substrates and Deep Submicron Process Modules Simoen, E., Mercha, A., Claeys, C. SPIE-The International Society for Optical Engineering
4 国際会議録 What Can Low-frequency Noise Learn us About the Quality of Thin-gate Dielectrics? Simoen, E., Mercha, A., Claeys, C. Electrochemical Society	10 国際会議録 Noise Diagnostics of Advanced Silicon Substrates and Deep Submicron Process Modules Simoen, E., Mercha, A., Claeys, C. Electrochemical Society
5 国際会議録 Interface defects of the new type detected by the noise method in SOI and SOS MOSFETs Lukyanchikova, N., Petrichuk, M., Garbar, N., Simoen, E., Claeys, C. Electrochemical Society	11 国際会議録 Evaluation of the Channel Engineering Impact on the Analog Performance of Deep-Submicrometer Partially Depleted SOI MOSFETs at Low Temperatures Pavanello, M. A., Martino, J. A., Simoen, E., Claeys, C. Electrochemical Society
6 国際会議録 Evidence for a 'linear kink effect' in ultra-thin gate oxide SOI MOSFETs Mercha, A., Simoen, E., Rafi, J.-M., Clacys, C., Lukyanchikova, N., Petrichuk, M., Garbar, N. Electrochemical Society	12 国際会議録 Comparison Between 0.13 μm Partially-Depleted Silicon-On-Insulator Technology with Floating Body Operation at 300 K and 90 K Pavanello, M.A., Martino, J.A., Mercha, A., Rafi, J.M., Simoen, E., Claeys, C., van Meer, H., De Meyer, K. Electrochemical Society

1

2

3

4

5

6

7

8

9

10

11

12