1/f noise in deep-submicron CMOS technology for RF and analog applications (Invited Paper)

1/f noise in deep-submicron CMOS technology for RF and analog applications (Invited Paper)

著者名:

Mercha, A. ( IMEC (Belgium) )
Simoen, E. ( IMEC (Belgium) )
Decoutere, S. ( IMEC (Belgium) )
Claeys, C. ( Katholieke Univ. Leuven (Belgium) )

掲載資料名:

Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5470

発行年:

2004

開始ページ:

193

終了ページ:

207

総ページ数:

15

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453969 [081945396X]

言語:

英語

請求記号:

P63600/5470

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014661
シリーズID:	PA00000029
会議名:	International Symposium on Fluctuations and Noise : Noise In Devices and Circuits
回次:	2004 : 2nd
会議開催地:	Maspalomas, Gran Canaria, Spain
会議開催年:	2004.05.26-2004.05.28

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