Wall-angle effects on the application of a scalar diffraction code to the channel data simulations in the high NA conditions

Wall-angle effects on the application of a scalar diffraction code to the channel data simulations in the high NA conditions

著者名:

Shin, Y. S. ( LG Electronics (South Korea) )
Ahn, S. K. ( LG Electronics (South Korea) )
Lee, M. H. ( LG Electronics (South Korea) )
Kim, J. -Y. ( LG Electronics (South Korea) )

掲載資料名:

Optical data storage 2004 : 18-21 April 2004, Monterey, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5380

発行年:

2004

開始ページ:

671

終了ページ:

677

総ページ数:

7

出版情報:

Bellingham: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819452931 [0819452939]

言語:

英語

請求記号:

P63600/5380

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014640
シリーズID:	PA00000029
会議名:	Optical Data Storage Topical Meeting
回次:	2004
会議開催地:	Monterey, CA, USA
会議開催年:	2004.04.18-2004.04.21

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