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A new method to measure the signal quality for high-density recording systems

著者名:
Cho, E. -S. ( Samsung Advanced Institute of Technology (South Korea) )
Lee, J. -W. ( Samsung Advanced Institute of Technology (South Korea) )
Lee, J. ( Samsung Advanced Institute of Technology (South Korea) )
Ryu, E. -J. ( Samsung Advanced Institute of Technology (South Korea) )
Konakov, M. ( Samsung Advanced Institute of Technology (South Korea) )
Shim, J. -S. ( Samsung Electronics Co., Ltd. (South Korea) )
Park, H. -S. ( Samsung Electronics Co., Ltd. (South Korea) )
さらに 2 件
掲載資料名:
Optical data storage 2004 : 18-21 April 2004, Monterey, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5380
発行年:
2004
開始ページ:
83
終了ページ:
89
総ページ数:
7
出版情報:
Bellingham: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452931 [0819452939]
言語:
英語
請求記号:
P63600/5380
資料種別:
国際会議録

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