Effects of surface roughness on large-volume CdZnTe nuclear radiation detectors and removal of surface damage by chemical etching
- 著者名:
Wright, G. W. ( Brookhaven National Lab. (USA) ) Camarda, G. ( Brookhaven National Lab. (USA) ) Kakuno, E. ( Brookhaven National Lab. (USA) ) Li, L. ( Yinnel Tech. Inc. (USA) ) Lu, F. ( Yinnel Tech. Inc. (USA) ) Lee, C. ( Yinnel Tech. Inc. (USA) ) Burger, A. ( Fisk Univ. (USA) ) Trombka, J. I. ( NASA Goddard Space Flight Ctr. (USA) ) Siddons, D. P. ( Brookhaven National Lab. (USA) ) James, R. B. ( Brookhaven National Lab. (USA) ) - 掲載資料名:
- Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5198
- 発行年:
- 2004
- 開始ページ:
- 306
- 終了ページ:
- 313
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819450715 [0819450715]
- 言語:
- 英語
- 請求記号:
- P63600/5198
- 資料種別:
- 国際会議録
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