Case against optical gauge block metrology (Invited Paper)
- 著者名:
- Doiroh, T.D. ( National Institute of Standards and Technology )
- Everett, D. ( National Institute of Standards and Technology )
- Faust, B.S. ( National Institute of Standards and Technology )
- Stanfield, E.S. ( National Institute of Standards and Technology )
- Stoup, J.R. ( National Institute of Standards and Technology )
- 掲載資料名:
- Recent Developments in Optical Gauge Block Metrology
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3477
- 発行年:
- 1998
- 開始ページ:
- 188
- 終了ページ:
- 198
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819429322 [0819429325]
- 言語:
- 英語
- 請求記号:
- P63600/3477
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |