Layer Thickness Dependence of Strain in GaN Grown by HVPE
- 著者名:
Sim, Gyu Gwang Yu, P.W. Reynolds, D.C. Look, D.C. Kim, Sang Soo Noh, D.Y. - 掲載資料名:
- GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 693
- 発行年:
- 2002
- 開始ページ:
- 171
- 終了ページ:
- 176
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558996298 [155899629X]
- 言語:
- 英語
- 請求記号:
- M23500/693
- 資料種別:
- 国際会議録
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11
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In Situ HREM Study on the Thermal Stability of Atomic Layer Epitaxy Grown InAs/GaAs Quantum Dots
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