Effect of Arsenic on Extended Defect Evolution in Silicon
- 著者名:
- 掲載資料名:
- Si front-end processing -- physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 669
- 発行年:
- 2001
- 総ページ数:
- 6
- 出版情報:
- Warrendale, PA: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558996052 [1558996052]
- 言語:
- 英語
- 請求記号:
- M23500/669
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
7
国際会議録
DEFECT STRUCTURES GENERATED BY BURIED AMORPHOUS LAYER REGROWTH IN <10> ARSENIC IMPLANTED SILICON
Materials Research Society |
MRS - Materials Research Society |
Electrochemical Society |
Materials Research Society |
Trans Tech Publications |
Electrochemical Society |
MRS - Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |