
In Situ HREM Study on the Thermal Stability of Atomic Layer Epitaxy Grown InAs/GaAs Quantum Dots
- 著者名:
Kim, H. S. Suh, J. H. Park, C. G. Lee, S. J. Noh, S. K. Song, J. D. Park, Y. J. Choi, W. J. Lee, J. I. - 掲載資料名:
- Electron microscopy of molecular and atom-scale mechanical behavior, chemistry and structure : symposium held November 29-December 1, 2004, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 839
- 発行年:
- 2005
- 開始ページ:
- 195
- 終了ページ:
- 200
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997875 [1558997873]
- 言語:
- 英語
- 請求記号:
- M23500/839
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering | |
SPIE - The International Society of Optical Engineering |
MRS - Materials Research Society |