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Vacancies in Electron Irradiated 6H Silicon Carbide Studied by Positron Annihilation Spectroscopy

著者名:
Lam, C.H.
Ling, C.C.
Beling, C.D.
Fung, S.
Weng, H.M
Hang, D.S.
さらに 1 件
掲載資料名:
Radiation effects and ion-beam processing of materials : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
792
発行年:
2004
開始ページ:
255
終了ページ:
260
総ページ数:
6
出版情報:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558997301 [155899730X]
言語:
英語
請求記号:
M23500/792
資料種別:
国際会議録

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