(Selective) Epitaxial Growth of Strained Si to Fabricate Low Cost and High Performance CMOS Devices
- 著者名:
Loo, R. Delhougne, R. Meunier-Beillard, P. Caymax, M. Verheyen, P. Eneman, G. Wolf, I.De Janssens, T. Benedetti, A. Meyer, K.De Vandervorst, W. Heyns, M. - 掲載資料名:
- High-mobility group-IV materials and devices : symposium held April 13-15, 2004, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 809
- 発行年:
- 2004
- 開始ページ:
- 3
- 終了ページ:
- 14
- 総ページ数:
- 12
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997592 [1558997598]
- 言語:
- 英語
- 請求記号:
- M23500/809
- 資料種別:
- 国際会議録
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A Thermal Migration of Ge During Junction Formation in s-Si Layers Grown on Thin SiGe-Buffer Layers
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A Thermal Migration of Ge During Junction Formation in s-Si Layers Grown on Thin SiGe-Buffer Layers
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Ge Island Evolution During Growth, In Situ Anneal, and Si Capping in an Industrial CVD Reactor
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