Accelerated Stress Testing of a-Si:H TFTs for AMOLED Displays
- 著者名:
Sakariya, Kapil Ng, Clement K.M. Huang, I-Heng Sultana, Afrin Tao, Sheng Nathan, Arokia - 掲載資料名:
- Amorphous and nanocrystalline silicon science and technology - 2004 : symposium held April 13-16, 2004, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 808
- 発行年:
- 2004
- 開始ページ:
- 661
- 終了ページ:
- 666
- 総ページ数:
- 6
- 出版情報:
- Warrendale: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997585 [155899758X]
- 言語:
- 英語
- 請求記号:
- M23500/808
- 資料種別:
- 国際会議録
類似資料:
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7
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Mechanical Stress and Process Integration of Direct X-ray Detector and TFT in a-Si:H Technology
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