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Stress Evolution in Integrated SrBi2Ta2O9 Ferroelectric Layers

著者名:
Lisoni, J. G.
Wafer, K.
Johnson, J. A.
Goux, L.
Schwitters, M.
Paraschiv, V.
Maes, D.
Haspeslagh, L.
Caputa, C.
Zambrano, R.
Wouters, D. J.
さらに 6 件
掲載資料名:
Ferroelectric thin films XII : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
784
発行年:
2004
開始ページ:
3
終了ページ:
8
総ページ数:
6
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997226 [1558997229]
言語:
英語
請求記号:
M23500/784
資料種別:
国際会議録

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