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Some Aspects of the Materials Science of Low-k Integration

著者名:
McGahay, Vincent  
掲載資料名:
Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics-2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
766
発行年:
2003
開始ページ:
47
終了ページ:
58
総ページ数:
12
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997035 [1558997032]
言語:
英語
請求記号:
M23500/766
資料種別:
国際会議録

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