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Study of Pore Architecture in Silicon Oxide Thin Films by Variable-Energy Positron Annihilation Spectroscopy

著者名:
Ito, Kenji
Kobayashi, Yoshinori
Yu, Runsheng
Hirata, Kouichi
Togashi, Hisashi
Suzuki, Ryoichi
Ohdaira, Toshiyuki
Egami, M.
Arao, H.
Sakurai, C.
Nakashima, A.
Komatsu, M.
さらに 7 件
掲載資料名:
Structure-property relationships of Oxide surfaces and interfaces II : symposium held December 2-3, 2002, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
751
発行年:
2003
開始ページ:
97
終了ページ:
102
総ページ数:
6
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996885 [1558996885]
言語:
英語
請求記号:
M23500/751
資料種別:
国際会議録

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