Mo-Si Interface Formation by Ion Beam Sputter Deposition
- 著者名:
Kohler, A. Gerlach, J.W. Hoche, T. Chasse, T. Neumann, H. Frank, W. Wagner, G. Rauschenbach, B. - 掲載資料名:
- Morphological and compositional evolution of thin films : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 749
- 発行年:
- 2003
- 開始ページ:
- 329
- 終了ページ:
- 334
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558996861 [1558996869]
- 言語:
- 英語
- 請求記号:
- M23500/749
- 資料種別:
- 国際会議録
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