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Structural Quality and Electrical Behavior of Epitaxial High-k Y2O3/Si(001)

著者名:
Vellianitis, G.
Apostolopoulos, G.
Dimoulas, A.
Argyropoulos, K.
Mereu, B.
Scholz, R.
Alexe, M.
Hooker, J. C.
さらに 3 件
掲載資料名:
Crystalline oxide-silicon heterostructures and oxide optoelectronics : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
747
発行年:
2003
開始ページ:
177
終了ページ:
182
総ページ数:
6
出版情報:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558996847 [1558996842]
言語:
英語
請求記号:
M23500/747
資料種別:
国際会議録

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