Z-Contrast Imaging and EELS of Dislocation Cores at the Si/GaAs Interface

Z-Contrast Imaging and EELS of Dislocation Cores at the Si/GaAs Interface

著者名:

掲載資料名:

Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

744

発行年:

2003

開始ページ:

25

終了ページ:

28

総ページ数:

4

出版情報:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558996816 [1558996818]

言語:

英語

請求記号:

M23500/744

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014404
シリーズID:	PA00000011
会議名:	Symposium on progress in semiconductors
回次:	2nd
会議開催地:	Boston, MA, USA
会議開催年:	2002.12.02-2002.12.05

類似資料:

1 国際会議録 SIMULATION AND QUANTIFICATION OF HIGH-RESOLUTION E-CONTRAST IMAGING OF SEMICONDUCTOR INTERFACES Jesson, D.E., Pennycook, S.J., Chisholm, M.F. Materials Research Society	7 国際会議録 ATOMIC SCALE STRUCTURE AND CHEMISTRY OF INTERFACES BY Z-CONTRAST IMAGING AND ELECTRON ENERGY LOSS SPECTROSCOPY IN THE STEM McGibbon, M. M., Browning, N. D., Chisholm, M. F., Pennycook, S. J., Ravikumar, V., Dravid, V. P. MRS - Materials Research Society
2 国際会議録 ATOMIC STRUCTURE AND CHEMISTRY OF Si/Ge INTERFACES DETERMINED BY E-CONTRAST STEM Chisholm, M.F., Pennycook, S.J., Jesson, D.E. Materials Research Society	8 国際会議録 ATOMIC SCALE STRUCTURE AND CHEMISTRY OF INTERFACES BY Z-CONTRAST IMAGING AND ELECTRON ENERGY LOSS SPECTROSCOPY IN THE STEM McGibbon, M. M., Browning, N. D., Chisholm, M. F., McGibbon, A. J., Pennycook, S. J., Ravikumar, V., Dravid, V. P. MRS - Materials Research Society
3 国際会議録 First-Principles Simulations and Z-Contrast Imaging of Impurities at <001> Tilt Grain Boundaries in MgO Yan, Y., Chisholm, M. F., Duscher, G., Pennycook, S. J., Maiti, A., Pantelides, S. T. MRS - Materials Research Society	9 国際会議録 Vacancy Formation and Vacancy-Induced Structural Transformation in Si Grain Boundaries Chisholm,M.F., Maiti,A., Pennycook,S.J., Pantelides,S.T. Trans Tech Publications
4 国際会議録 *DIRECT IMAGING OF THE ATOMIC STRUCTURE AND CHEMISTRY OF DEFECTS AND INTERFACES BY Z-CONTRAST STEM Pennycook, S.J., Chisholm, M.F., Jesson, D.E., Norton, D.P., McCamy, J.W., Lowndes, D.H. Materials Research Society	10 国際会議録 DIRECT SUB-LATTICE IMAGING OF INTERFACE DISLOCATION STRUCTURES IN CdTe/GaAs(001) McGibbon, A. J., Pennycook, S. J., Angelo, J. E., Mills, M. J. MRS - Materials Research Society
5 国際会議録 Atomic-resolution Z-contrast imaging and its application to compositional ordering and segregation Pennycook, S. J., Yan, Y., Norman, A., Zhang, Y., Al-Jassim, M., Mascarenhas, A., Ahrenkiel, S. P., Chisholm, M. F., … MRS-Materials Research Society	11 国際会議録 Z-contrast STEM imaging and EELS of CdSe nanocrystals: Towards the analysis of individual nanocrystal surfaces Kadavanich, A. V., Kippeny, T., Erwin, M., Rosenthal, S. J., Pennycook, S. J. MRS-Materials Research Society
6 国際会議録 *INCOHERENT IMAGING OF MATERIALS STRUCTURE AND COMPOSITION BY Z-CONTRAST STEM Pennycook, S. J., Jesson, D. E., Chisholm, M. F. Materials Research Society	12 国際会議録 Z-contrast STEM imaging and EELS of CdSe nanocrystals: Towards the analysis of individual nanocrystal surfaces Kadavanich, A. V., Kippeny, T., Erwin, M., Rosenthal, S. J., Pennycook, S. J. MRS-Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12