Blank Cover Image

Characterization of carrier generation in thin-film SOI devices by reverse gated-diode technique and its application at high temperatures

著者名:
掲載資料名:
Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment
シリーズ名:
NATO science series. Series 2, Mathematics, physics and chemistry
シリーズ巻号:
185
発行年:
2005
開始ページ:
247
終了ページ:
254
総ページ数:
8
出版情報:
Dordrecht: Kluwer Academic Publishers
ISBN:
9781402030116 [1402030118]
言語:
英語
請求記号:
N17050/185
資料種別:
国際会議録

類似資料:

Rudenko, T.E., Kilchytska, V.I.

Kluwer Academic Publishers

Rudenko, T., Rudenko, A., Kilchitskaya, V.

Electrochemical Society

Picun, G., Demeus, L., Flandre, D.

Electrochemical Society

dos Santos, C. D. G., Pavanello, M. A., Martino, J. A., Flandre, D., Raskin, J.-P.

Electrochemical Society

Kilchytska, V., Vancaillie, L., de Meyer, K., Flandre, D.

Kluwer Academic Publishers

J. Alvarado, A. Cerdeira, V. Kilchytska, D. Flandre

Electrochemical Society

Levacq, D., Dessard, V., Flandre, D.

Kluwer Academic Publishers

R. T. Doria, M. A. Pavanello, A. Cerdeira, J. Raskin, D. Flandre

Electrochemical Society

PieCin, G., Flandre, D.

Electrochemical Society

Vandooren, A., Cristoloveanu, S., Colinge, J.P., Flandre, D.

Electrochemical Society

Godignon, P., Vellvehi, M., Flores, D., Millan, J., Hagelsieb, L., Moreno, Flandre D.

Kluwer Academic Publishers

Chen, J., Colinge, J.P., Flandre, D., Gillon, R., Raskin, J.P., Vanhoenacker, D.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12