Noise and Tunneling Through the 2.5 nm Gate Oxide in SOI MOSFETs
- 著者名:
- 掲載資料名:
- Advanced experimental methods for noise research in nanoscale electronic devices
- シリーズ名:
- NATO science series. Series 2, Mathematics, physics and chemistry
- シリーズ巻号:
- 151
- 発行年:
- 2004
- 開始ページ:
- 129
- 終了ページ:
- 136
- 総ページ数:
- 8
- 出版情報:
- Dordrecht: Kluwer Academic Publishers
- ISBN:
- 9781402021688 [1402021682]
- 言語:
- 英語
- 請求記号:
- N17050/151
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
Electrochemical Society |
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Kluwer Academic Publishers |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |