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Noise and Tunneling Through the 2.5 nm Gate Oxide in SOI MOSFETs

著者名:
掲載資料名:
Advanced experimental methods for noise research in nanoscale electronic devices
シリーズ名:
NATO science series. Series 2, Mathematics, physics and chemistry
シリーズ巻号:
151
発行年:
2004
開始ページ:
129
終了ページ:
136
総ページ数:
8
出版情報:
Dordrecht: Kluwer Academic Publishers
ISBN:
9781402021688 [1402021682]
言語:
英語
請求記号:
N17050/151
資料種別:
国際会議録

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