Measurement and Analysis of Surface Residual Stress of Railroad Wheels with X-Ray Method
- 著者名:
- 掲載資料名:
- Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 490-491
- 発行年:
- 2005
- 開始ページ:
- 311
- 終了ページ:
- 316
- 総ページ数:
- 6
- 出版情報:
- Uetikon-Zuerich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878499694 [0878499695]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers | |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
Trans Tech Publications |
10
国際会議録
Measurement of residual stress in multilayered thin films by a full-field optical method [6032-21]
SPIE - The International Society of Optical Engineering |
Trans Tech Publications |
11
国際会議録
Effects of Heat Transfer Coefficients on Quenching Residual Stresses in 7055 Aluminum Alloy
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |