X-Ray Stress Measurement Using Whole Back Diffraction Ring

X-Ray Stress Measurement Using Whole Back Diffraction Ring

著者名:

掲載資料名:

Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004

シリーズ名:

Materials science forum

シリーズ巻号:

490-491

発行年:

2005

開始ページ:

137

終了ページ:

142

総ページ数:

6

出版情報:

Uetikon-Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878499694 [0878499695]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014245
シリーズID:	PA00000012
会議名:	International Conference on Residual Stresses : ICRS
回次:	7th
会議開催地:	Xi'an, China
会議開催年:	2004.06.14-2004.06.17

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