Application of X-Ray and Neutron Diffraction Methods to Reliability Evaluation of Structural Components and Electronic Device
- 著者名:
- 掲載資料名:
- Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 490-491
- 発行年:
- 2005
- 開始ページ:
- 19
- 終了ページ:
- 27
- 総ページ数:
- 9
- 出版情報:
- Uetikon-Zuerich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878499694 [0878499695]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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