A Short Synopsis of the Current Status of Porous SiC and GaN

A Short Synopsis of the Current Status of Porous SiC and GaN

著者名:

掲載資料名:

Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy

シリーズ名:

Materials science forum

シリーズ巻号:

483-485

発行年:

2005

開始ページ:

251

終了ページ:

256

総ページ数:

6

出版情報:

Uetikon-Zuerich: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878499632 [0878499636]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014242
シリーズID:	PA00000012
会議名:	ECSCRM : European Conference on Silicon Carbide and Related Materials
回次:	2004 : 5th
会議開催地:	Bologna, Italy
会議開催年:	2004.08.31-2004.09.04

類似資料:

1 国際会議録 Porous Structure of Anodized p-Type 6H SiC Shishkin, Y., Ke, Y., Devaty, R.P., Choyke, W.J. Trans Tech Publications	7 国際会議録 Porous Silicon Carbide as a Membrane for Implantable Biosensors Rosenbloom, A.J., Shishkin, Y., Sipe, D.M., Ke, Y., Devaty, R.P., Choyke, W.J. Trans Tech Publications
2 国際会議録 CVD Epitaxial Growth of 4H-SiC on Porous SiC Substrates Shishkin, Y., Ke, Y., Yan, F., Devaty, R.P., Choyke, W.J., Saddow, S.E. Trans Tech Publications	8 国際会議録 Modification of the Oxide/Semiconductor Interface by High Temperature NO Treatments: A Combined EPR, NRA and XPS Study on Oxidized Porous and Bulk n-Type 4H-SiC Bardeleben, H. J. von, Cantin, J. L., Vickridge, I., Song, Y., Dhar, S., Feldman, L. C., Williams, J. R., Ke, L., … Trans Tech Publications
3 国際会議録 Interface Defects in n-Type 3C-SiC/SiO2: An EPR Study of Oxidized Porous Silicon Carbide Single Crystals Bardeleben, H. J. von, Cantin, J. L., Ke, L., Shishkin, Y., Devaty, R. P., Choyke, W. J. Trans Tech Publications	9 国際会議録 Brillouin Scattering Studies of Surface Acoustic Waves in SiC Andrews, G.T., Clouter, M.J., Mroz, B., Shishkin, Y., Ke, Y., Devaty, R.P., Choyke, W.J. Trans Tech Publications
4 国際会議録 Raman Spectra of a 4H-SiC Epitaxial Layer on Porous and Non-Porous 4H-SiC Substrates M.J. Clouter, Y. Ke, R.P. Devaty, W.J. Choyke, Y. Shishkin, S.E. Saddow Trans Tech Publications	10 国際会議録 Microscopic Structure and Electrical Activity of 4H-SiC/SiO2 Interface Defects : an EPR Study of Oxidized Porous SiC von Bardeleben, H.J., Cantin, J.L., Shishkin, Y., Devaty, R.P., Choyke, W.J. Trans Tech Publications
5 国際会議録 Optical Lifetime Measurements in 4H SiC Shishkin, Y., Devaty, R. P., Choyke, W. J. Trans Tech Publications	11 国際会議録 Elastic Waves in Nano-Columnar Porous 4H-SiC Measured by Brillouin Scattering R.P. Devaty, M.J. Clouter, Y. Ke, W.J. Choyke Trans Tech Publications
6 国際会議録 Triangular Pore Formation in Highly Doped n-Type 4H SiC Shishkin, Y., Choyke, W.J., Devaty, R.P. Trans Tech Publications	12 国際会議録 Nano-Columnar Pore Formation in the Photo-Electrochemical Etching of n-Type 6H SiC Y. Ke, R.P. Devaty, W.J. Choyke Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12