Photoemission Study of the Silicate Adlayer Reconstruction on Si-terminated 6H-SiC(0001)

Photoemission Study of the Silicate Adlayer Reconstruction on Si-terminated 6H-SiC(0001)

著者名:

掲載資料名:

Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999

シリーズ名:

Materials science forum

シリーズ巻号:

338-342(1)

発行年:

2000

開始ページ:

391

終了ページ:

394

総ページ数:

4

出版情報:

Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878498543 [0878498540]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014226
シリーズID:	PA00000012
会議名:	International Conference on Silicon Carbide and Related Materials : ICSCRM
回次:	1999
会議開催地:	Research Triangle Park, North Carolina, USA
会議開催年:	1999.10.10-1999.10.15

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2 国際会議録 A High-Resolution Photoemission Study of Hydrogen-Terminated 6H-SiC Surfaces Sieber, N., Seyller, T., Ley, L., Polcik, M., James, D., Riley, J.D., Leckey, R.C.G. Trans Tech Publications	8 国際会議録 High Resolution Photoemission Study of the 6H-SiC/SiO2 Interface Mattern,B., Bassler,M., Pensl,G., Ley,L. Trans Tech Publications
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