X-Ray Diffraction Characterization of Textured Films Accounting for Secondary Extinction

X-Ray Diffraction Characterization of Textured Films Accounting for Secondary Extinction

著者名:

掲載資料名:

EPDIC 6 : proceedings of the sixth European Powder Diffraction Conference, held August 22-25, 1998 in Budapest, Hungary

シリーズ名:

Materials science forum

シリーズ巻号:

321-324(1)

発行年:

2000

開始ページ:

137

終了ページ:

143

総ページ数:

7

出版情報:

Zuerich-Uetikon, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878498475 [0878498478]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014218
シリーズID:	PA00000012
会議名:	EPDIC : European Powder Diffraction Conference
回次:	6th
会議開催地:	Budapest, Hungary
会議開催年:	1998.08.22-1998.08.25

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1 国際会議録 Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction Tomov,I. Trans Tech Publications	7 国際会議録 Texture and Secondary Extinction of Vacuum Deposited Ag Films Tomov, I., Adamik, M., Barna, P. B. Trans Tech Publications
2 国際会議録 Accounting for Secondary Extinction in Thickness Measurement of Thin Films by X-Ray Absorption Tomov, I. Trans Tech Publications	8 国際会議録 Time resolved x-ray diffraction in solids and liquids Tomov V. I., Chen P., Rentzepis M. P. Kluwer Academic Publishers
3 国際会議録 Single Reflection Method for Pole-Density Measurements Accounting for Secondary Extinction in Textured Films Tomov, I. Trans Tech Publications	9 国際会議録 Application of the Monte Carlo Method to Fiber Texture of Electrolytically Deposited Ni Films Fuller, T., Krezhov, K., Tomov, I., Konstantinov, P. Trans Tech Publications
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6 国際会議録 X-Ray Diffraction Study of Texture Evolution in Electrodeposited Zinc Layers Tomov,I. Trans Tech Publications	12 国際会議録 CHARACTERIZATION OF STRESS AND TEXTURE IN RTCVD POLY-Si LAYERS BY X-RAY DIFFRACTION Barsony, Istvan, Klappe, Joe G. E., Ryan, Tom W. Materials Research Society

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