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The Dependence of Poly-Si TFT Characteristics on the Relative Misorientation Between Grain Boundaries and the Active Channel

著者名:
Jung, Y.H.
Yoon, J.M.
Yang, M.S.
Park, W.K.
Soh, H.S.
Cho, H.S.
Limanov, A.B.
Im, J.S.
さらに 3 件
掲載資料名:
Electron-emissive materials, vacuum microelectronics and flat-panel displsys : symposium held April 25-27 2000, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
621
発行年:
2001
開始ページ:
Q9.14
出版情報:
Pittsburgh, PA.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995291 [1558995293]
言語:
英語
請求記号:
M23500/621
資料種別:
国際会議録

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