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In Situ Real-Time Studies of Oxygen Incorporation in Complex Oxide Thin Films Using Spectroscopic Ellipsometry and Ion Scattering and Recoil Spectrometry

著者名:
Mueller, A.H.
Gao, Y.
Irene, E.A.
Auciello, O.
Krauss, A.R.
Schultz, J.A.
さらに 1 件
掲載資料名:
Recent developments in oxide and metal epitaxy : theory and experiment
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
619
発行年:
2000
開始ページ:
141
終了ページ:
148
総ページ数:
8
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995277 [1558995277]
言語:
英語
請求記号:
M23500/619
資料種別:
国際会議録

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