An Optical Gap Calibration Applied to the Case of Hydrogenated Amorphous Silicon
- 著者名:
- 掲載資料名:
- Amorphous and heterogeneous silicon thin films : fundamentals to devices - 1999 : symposium held April 5-9, 1999, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 557
- 発行年:
- 1999
- 開始ページ:
- 55
- 終了ページ:
- 60
- 総ページ数:
- 6
- 出版情報:
- Warrendale: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994645 [1558994645]
- 言語:
- 英語
- 請求記号:
- M23500/557
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
MRS - Materials Research Society |
2
国際会議録
Deuterium Incorporation into Glow-Discharge Deposited Deuterated-Hydrogenated Amorphous Silicon
MRS - Materials Research Society |
MRS - Materials Research Society |
3
国際会議録
Amorphous Silicon Films And Superlattices Grown By Molecular Beam Epitaxy: An Optical Analysis
Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
Electrochemical Society |
Materials Research Society |
MRS - Materials Research Society |
MRS-Materials Research Society |
Plenum Press |