Effect of Stress on the Density of Deep Localized States in Amorphous Silicon Thin Film Transistors

Effect of Stress on the Density of Deep Localized States in Amorphous Silicon Thin Film Transistors

著者名:

掲載資料名:

Proceedings of the Second Symposium on Thin Film Transistor Technologies

シリーズ名:

Electrochemical Society Proceedings Series

シリーズ巻号:

1994-35

発行年:

1994

開始ページ:

207

終了ページ:

218

総ページ数:

12

出版情報:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566770941 [1566770947]

言語:

英語

請求記号:

E23400/950720

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014144
シリーズID:	PA00000028
会議名:	Symposium on Thin Film Transistor Technologies
回次:	2nd
会議開催地:	Miami Beach, Florida, USA
会議開催年:	1994.10.10-1994.10.14

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2 国際会議録 SPICE Models for Amorphous Silicon and Polysilicon Thin Film Transistors Shur, M.S., Jacunski, M.D., Slade, H.C., Owusu, A.A., Ytterdal, T., Hack, M. Electrochemical Society	8 国際会議録 THEORY OF VERTICAL AMORPHOUS SILICON THIN-FILM TRANSISTORS Shaw, J. C., Hack, M. Materials Research Society
3 国際会議録 Temperature and Frequency Dependent Characteristics of Amorphous Silicon Thin Film Transistors Slade, H. C., Shur, M. S., Hack, M. MRS - Materials Research Society	9 国際会議録 PROXIMITY RECOVERY LAYERS TO SPEED UP THE RECOVERY OF STRESSED AMORPHOUS SILICON THIN-FILM TRANSISTORS Hack, M., Jackson, W. B., Lujan, R. Materials Research Society
4 国際会議録 DETERMINATION OF DENSITY OF LOCALIZED STATES IN AMORPHOUS SILICON ALLOYS FROM THE LOW FIELD CONDUCTANCE OF THIN N-I-N DIODES Shur, M., Hack, M. Materials Research Society	10 国際会議録 EXPERIMENTAL AND THEORETICAL ANALYSIS OF THE ABOVE THRESHOLD CHARACTERISTICS OF AMORPHOUS SILICON ALLOY FIELD EFFECT TRANSISTORS Hack, M., Shur, M., Hyun, C., Yaniv, Z., Cannella, V., Yang, M. Materials Research Society
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