Total Reflection X-Ray Fluorescence Spectroscopy: Analysis of Semiconductor Materials
- 著者名:
- 掲載資料名:
- Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 1994-33
- 発行年:
- 1994
- 開始ページ:
- 322
- 終了ページ:
- 337
- 総ページ数:
- 16
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566770927 [1566770920]
- 言語:
- 英語
- 請求記号:
- E23400/951106
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
Materials Research Society |
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
3
国際会議録
TRACE ANALYSIS OF SILICON SURFACES USING ANGLE- DEPENDENT TOTAL-REFLECTION X-RAY FLUORESCENCE
Electrochemical Society |
American Chemical Society |
4
国際会議録
Use and function of TXRF(total reflection x-ray fluorescence)for routine in fab metallic monitoring
SPIE - The International Society for Optical Engineering |
10
国際会議録
Fluorescence correlation spectroscopy on dielectric surfaces in total internal reflection geometries
SPIE - The International Society of Optical Engineering |
Martinus Nijhoff Publishers | |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |