METAL CONTAMINATION AND SILICON DAMAGE EFFECTS OF OXIDE PLASMA ETCH PROCESSES
- 著者名:
Vincs, L. Fujishiro, F. Echtle, D. Garcia, A. Han, Y.-P. Loh, Y.T. Delgado, M. Parmantie, W. - 掲載資料名:
- Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing III
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 1994-9
- 発行年:
- 1994
- 開始ページ:
- 141
- 終了ページ:
- 153
- 総ページ数:
- 13
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566770415 [1566770416]
- 言語:
- 英語
- 請求記号:
- E23400/941386
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
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SPIE-The International Society for Optical Engineering |
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Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society |
Materials Research Society |