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The Effect of COP on the Dielectric Breakdown Characteristics of Silicon MOS Capacitor

著者名:
Shiota, T.
Morita, E.
Furukawa, J.
Furuya, H.
Shingyouji, T.
Shimanuki, Y.
さらに 1 件
掲載資料名:
Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing II
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
1994-3
発行年:
1994
開始ページ:
211
終了ページ:
221
総ページ数:
11
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566770651 [1566770653]
言語:
英語
請求記号:
E23400/941395
資料種別:
国際会議録

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