Correlat ion of Substrate D-Defects in CZ Silicon with MOS Breakdown
- 著者名:
Park, J-G. Kirk, H. Lee, C-S. Lee, H-K. Lee, D-M. Rozgonyi, G.A. - 掲載資料名:
- Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 1994-1
- 発行年:
- 1994
- 開始ページ:
- 57
- 終了ページ:
- 71
- 総ページ数:
- 15
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566770378 [1566770378]
- 言語:
- 英語
- 請求記号:
- E23400/941393
- 資料種別:
- 国際会議録
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