TRACE ANALYSIS OF SILICON SURFACES USING ANGLE- DEPENDENT TOTAL-REFLECTION X-RAY FLUORESCENCE
- 著者名:
Streckfuss, N. Frey, L. Pichler, P. Kuegel, M. Zielonka, G. Ryssel, H. - 掲載資料名:
- Proceedings of the Satellite Symposium to ESSDERC 93 Grenoble/France : crystalline defects and contamination: their impact and control in device manufacturing
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 1993-15
- 発行年:
- 1993
- 開始ページ:
- 222
- 終了ページ:
- 231
- 総ページ数:
- 10
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566770590 [1566770599]
- 言語:
- 英語
- 請求記号:
- E23400/932030
- 資料種別:
- 国際会議録
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