COPPER LOW-k CONTAMINANTION AND POST ETCH RESIDUES REMOVAL USING SUPERCRITICAL C02-BASED PROCESSES
- 著者名:
Millet, C. Daviot, J. Danel, A. Perrut, V. Tardif, F. Broussous, L. Renault, O. - 掲載資料名:
- Cleaning technology in semiconductor device manufacturing VIII : proceedings of the international symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2003-26
- 発行年:
- 2003
- 開始ページ:
- 271
- 終了ページ:
- 278
- 総ページ数:
- 8
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774116 [156677411X]
- 言語:
- 英語
- 請求記号:
- E23400/200326
- 資料種別:
- 国際会議録
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