The Effect of External Strain on the Conductivity of AIGaN/GaN High Electron Mobility Transistors
- 著者名:
Kang, B.S. Kim, S. Kim, J. Ren, F. Baik, K. Pearton, S.J. Gila, B.P. Abernathy, C.R. Pan, C.-C. Chen, G.-T. Chyi, J.-I. Chandrasekaran, V. Sheplak, M. Nishida, T. Chu, S.N.G. - 掲載資料名:
- State-of-the-art program on compound semiconductors XXXIX and nitride and wide bandgap semiconductors for sensors, photonics, and electronics IV : proceedings of the international symposia
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2003-11
- 発行年:
- 2003
- 開始ページ:
- 292
- 終了ページ:
- 297
- 総ページ数:
- 6
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773911 [1566773911]
- 言語:
- 英語
- 請求記号:
- E23400/200311
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Materials Research Society |
Electrochemical Society |
Electrochemical Society |
6
国際会議録
Novel Oxides and Reliability for the Passivation of AlGaN/GaN High Electron Mobility Transistor
Electrochemical Society |
Trans Tech Publications |