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Degradation of Deep Submicron Partially Depleted SOI CMOS iransistors tinder MEV Proton or Gamma Irradiation

著者名:
Simoen, E.
Rafi, J.M.
Mercha, A.
De Meyer, K.
Claeys, C.
Kokkoris, M.
Kossionides, E.
Fanourakis, G.
Mohhaindzadeh, A.
さらに 4 件
掲載資料名:
Microelectronics technology and devices : SBMICRO 2003 : proceedings of the eighteenth international symposium
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
2003-9
発行年:
2003
開始ページ:
18
終了ページ:
27
総ページ数:
10
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773898 [156677389X]
言語:
英語
請求記号:
E23400/200309
資料種別:
国際会議録

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