Blank Cover Image

Nature of high-temperature charge instability of fully depleted SOI MOSFETs

著者名:
掲載資料名:
Silicon-on-insulator technology and devices XI : proceedings of the international symposium
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
2003-5
発行年:
2003
開始ページ:
455
終了ページ:
460
総ページ数:
6
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773751 [156677375X]
言語:
英語
請求記号:
E23400/200305
資料種別:
国際会議録

類似資料:

1 国際会議録 High-temperature behavior of fully-depleted SOI MOSFETs in case of charge instability of buried oxide

Nazarov, A.N., Houk, Y., Vovk, Ya.N., Lysenko, V.S., Flandre, D.

Electrochemical Society
7 国際会議録 Properties of SOI MOSFET's obtained on multilayer buried dielectrics

Lysenko, V.S., Nazarov, A.N., Rudenko, T.E., Rudenko, A.N., Kilchitskaya, V.I., Givargizov, E.I., Limanov, A.B.

Electrochemical Society
2 国際会議録 Radiation effect on electrical properties of fully-depleted UNIBOND SOI MOSFETs

Houk, Y., Nazarov, A. N., Turchanikov, V. I., Lysenko, V. S., Adriaensen, S., Flandre, D.

Kluwer Academic Publishers
8 国際会議録 Investigation of charge control related performances In double-gate SOI MOSFETs

Kiichytska, V., Chung, T.M., van Meer, H., de Meyer, K., Raskin, J.P., Flandre, D.

Electrochemical Society
3 国際会議録 Parameter Extraction for Buried Oxide Traps from High-Temperature Kink Effect of Back- Channel SOI TM n-MOSFET

Nazarov, A N, Barchuk, I P, Lysenko, V S L, Colinge, J P

Electrochemical Society
9 国際会議録 Characterization of SOI MOSFETs at microwave frequencies

Gillon, R., Raskin, J.P., Vanhoenacker, D., Colinge, J.P., Dambrine, G.

Electrochemical Society
4 国際会議録 Hydrogen and high-temperature charge instability of SOI structures and MOSFETs

Nazarov, A.N.

Kluwer Academic Publishers
10 国際会議録 Charge Trapping in High-Dose Ge-Implanted and Si- Implanted Silicon-Dioxide Thin Films

Nazarov, A.N., Osiyuk, I.N., Tyagulskii, I.P., Lysenko, V.S., Gebel, T., Skorupa, W.

Electrochemical Society
5 国際会議録 Performance of Double-Gate SOI nMOSFETs at Low Temperature

Vandooren, A., Cristoloveanu, S., Colinge, J.P., Flandre, D.

Electrochemical Society
11 国際会議録 Investigation of salicide processes for thin film SOI microwave applications

Chen, J., Colinge, J.P., Flandre, D., Gillon, R., Raskin, J.P., Vanhoenacker, D.

Electrochemical Society
6 国際会議録 N. DHalleweyn, J. Benson. M. Swanenbeig, W. Redman-Whizc A New Fully-Depleted SOI MOSFET Macro-Model Valid from DC to RF

Raskin, B. Inilguez. J.P., Demeus, L., Neve, A., Goffioul, M., Simon, P., Vanhoenacker, D., Flandre, D.

Electrochemical Society
12 国際会議録 Meta-stable dip (MSD) effect in fully-depleted SOI CMOSFETs

Bawedin, M., Yun, J.G., Cristoloveanu, S., Lee, H.D., Raynaud, C., Flandre, D.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12