In-Situ Observations of Point Defect Generation and Complexing During Electron Beam Irradiation of Nitrogen Doped Czochralski Silicon
- 著者名:
- 掲載資料名:
- High purity silicon VII : proceedings of the international symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2002-20
- 発行年:
- 2002
- 開始ページ:
- 347
- 終了ページ:
- 356
- 総ページ数:
- 10
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773447 [156677344X]
- 言語:
- 英語
- 請求記号:
- E23400/200220
- 資料種別:
- 国際会議録
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