Aluminum Corrosion at Systems of Engineered Cu Particles

Aluminum Corrosion at Systems of Engineered Cu Particles

著者名:

Missert, N.

掲載資料名:

Corrosion science : a retrospective and current status in honor of Robert P. Frankenthal : proceedings of the international symposium

シリーズ名:

Electrochemical Society Proceedings Series

シリーズ巻号:

2002-13

発行年:

2002

開始ページ:

307

終了ページ:

313

出版情報:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566773355 [1566773350]

言語:

英語

請求記号:

E23400/200213

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014047
シリーズID:	PA00000028
会議名:	International Symposium on Corrosion Science ; Centennial Electrochemical Society Meeting
回次:	2002 ; 201st
会議開催地:	Philadelphia, PA, USA
会議開催年:	2002.05.13-2002.05.16

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1 国際会議録 CREVICE CORROSION INITIATION AT ENGINEERED Cu-RICH DEFECTS IN Al THIN FILMS Missert, N., Son, K.A., Wall, F.D., Barbour, J.C., Sullivan, J.P., Zavadil, K.R., Copeland, R.G., Martinez, M.A., … Electrochemical Society	7 国際会議録 The Influence of Nanoengineered Cu Defects on Alumninum Pitting Initiation Wall, F.D., Son, K.-A., Missert, N.A., Barbour, J., Martinez, M.A., Zavadil, K.R., Sullivan, J.P., Copeland, R.G., … Electrochemical Society
2 国際会議録 Interactions Among Pitting Sites in Aluminum at Engineered Copper Particles Missert, N., Copeland, R. G., Wall, F. D., Johnson, C. M., Barbour, J. C. Electrochemical Society	8 国際会議録 Pit Initiation in AlOx/Al Thin Films Son, K.-A., Barbour, J.C., Missert, N.A., Wall, F.D., Copeland, R.G., Martinez, M.A., Minor, K.G., Buchheit, R.G., … Electrochemical Society
3 国際会議録 Evolution of Al Corrosion at Engineered Cu Islands Missert, N., Copeland, R.G., Barbour, J.C., Mikkalson, J. Electrochemical Society	9 国際会議録 Does Anything Pin the Pitting Behavior of Aluminum? Wall, F., Martinez, M., Johnson, C., Barbour, J., Missert, N., Copeland, R. Electrochemical Society
4 国際会議録 Exploring the Relationship of Morphology and Structure to Pit Initiation in Cl-Implanted Al Thin Films Missert, N., Copeland, R.G., Johnson, C.M., Kotula, P.G., Ellswick, D., Hren, J.J. Electrochemical Society	10 国際会議録 The Electrical Properties of Native and Deposited Thin Aluminum Oxide Layers on Aluminum: Hydration Effects Sullivan, J.P., Barbour, J.C., Dunn, R.G., Son, K.-A., Montes, L.P., Missert, N., Copeland, R.G. Electrochemical Society
5 国際会議録 In-Situ Fluorescence Microscopy of Al Thin Film Corrosion at Engineered Cu Islands Missert, N., Copeland, R.C., Barbour, J.C., Mikkalson, J.E., Isaacs, H. Electrochemical Society	11 国際会議録 Electronic Defects and Interface Potentials for Al Oxide Films on Al and Their Relationship to Electrochemical Properties Sullivan, J.P., Dunn, R.G., Barbour, J.C., Wall, F.D., Missert, N., Buchheil, R.G. Electrochemical Society
6 国際会議録 Generation of Chloride Active Defects at the Aluminum Oxide Surface for the Study of Localized Corrosion Initiation Zavadil, K.R., Barbour, J.C., Wall, F.D., Son, K.-A., Missert, N. Electrochemical Society	12 国際会議録 The Effect of Implanted CL on the Pitting Behavior of Aluminum Thin Films Serna, L.M., Johnson, C.M., Wall, F.D., Barbour, J.C. Electrochemical Society

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