Challenges and Opportunities in High-K Gate Dielectric Technology
- 著者名:
Niwa, M. Harada, Y. Yamamoto, K. Hayashi, S. Mitsuhashi, R. Eriguchi, K. Kubota, M. Hoshino, Y. Kido, Y Kwong, D.L. - 掲載資料名:
- Rapid thermal and other short-time processing technologies III : proceedings of the international symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2002-11
- 発行年:
- 2002
- 開始ページ:
- 99
- 終了ページ:
- 116
- 総ページ数:
- 18
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773348 [1566773342]
- 言語:
- 英語
- 請求記号:
- E23400/200211
- 資料種別:
- 国際会議録
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8
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