Advanced Silicon Wafers for 0.18 μm Design Rule and Beyond: Epi and fFLASH!*
- 著者名:
Schmolke, R. Blietz, M. Schauer, R. Zemke, D. Oelkrug, H. Ammon, W.v. Lambert, U. Grtlf, D. - 掲載資料名:
- High Purity Silicon VI : proceedings of the sixth International Symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2000-17
- 発行年:
- 2000
- 開始ページ:
- 3
- 終了ページ:
- 18
- 総ページ数:
- 16
- 出版情報:
- Bellingham, Wash.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566772846 [1566772842]
- 言語:
- 英語
- 請求記号:
- E23400/200017
- 資料種別:
- 国際会議録
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4
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The Impact of Crystal Quality by Delineation of COP and the Impact on the Silicon Wafer Surface
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