Blank Cover Image

Characterization of Gd2O3 Films Deposited on Si(l00) by E-Beam Evaporation from Pressed-Powder Targets

著者名:
Landheer, D. ( (National Research Council of Canada) )
Gupta, J. ( (National Research Council of Canada) )
Hulse, J. ( (National Research Council of Canada) )
Sproule, I. ( (National Research Council of Canada) )
McCaffrey, J. ( (National Research Council of Canada) )
Graham, M. ( (National Research Council of Canada) )
Yang, K.-C. ( (University of Toronto) )
Lu, Z. ( (University of Toronto) )
Lennard, W.N. ( (University of Western Ontario) )
さらに 4 件
掲載資料名:
Low and high dielectric constant materials : materials science, processing, and reliability issues : proceedings of the fifth international symposium
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
2000-5
発行年:
2000
開始ページ:
193
終了ページ:
204
総ページ数:
12
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772709 [1566772702]
言語:
英語
請求記号:
E23400/2000-5
資料種別:
国際会議録

類似資料:

1 国際会議録 Properties of Gate-Quality Silicon Nitride and Oxynitride Dielectrics Deposited Using an Electron Cyclotron-Resonance Plasma Source

Landheer, D., Hulse, J.E., Quance, T., Aers, G.C., Sproule, G.I., Lennard, W.N., Simpson, P.J., Nlassoumi, G.R.

Electrochemical Society
7 国際会議録 Near-UV to IR optical characterization of YF3 thin films deposited by evaporation and ion beam processes

Quesnel,E., Berger,M., Cigna,J., Duca,D., Pelle,C., Pierre,F.

SPIE-The International Society for Optical Engineering
2 国際会議録 Characterization of (I00)InP after surface passivation as studied by AFM, XPS and SIMS

Maurice, V., Marcus, P., Mason, B., Lu, Z.H., Gao, L.J., Sproule, G.I., Sundersena Rao, T., Graham, M.J.

Electrochemical Society
8 国際会議録 Optical and structural characterization of nc-Si/a-SiO2 superlattices

Grom,G., Tsybeskov,L., Hirschman,K.D., Fauchet,P.M., Zacharias,M., Blanton,T.N., McCaffrey,J.P., Baribeau,J.-M., …

SPIE - The International Society for Optical Engineering
3 国際会議録 Properties of Gate-Quality SiO2 Films Prepared by Electron Cyclotron Resonance Chemical Vapour Deposition in an Ultra-High Vacuum Processing System

Tao, Y., Landheer, D., Hulse, J. E., Xu, D. -X., Quance, T.

MRS - Materials Research Society
9 国際会議録 ZrO2 thin films deposited on various LiB3O5 substrates by electron beam evaporation

Tan, T., Huang, J., Zhan, M., Tian, G., Shao, J., Fan, Z.

SPIE - The International Society of Optical Engineering
4 国際会議録 Thermal Oxidation of III-V Materials and Heterostructures

Hussey, R.J., Driad, R., Sproule, G.I., Moisa, S., Fraser, J.W., Wasilewski, Z.R., McCaffrey, J.P., Landheer, D., …

Electrochemical Society
10 国際会議録 Characterization of Deposited GaAs Films from Alkaline Electrolytes

Yang, M-C., Gong, J.

Electrochemical Society
5 国際会議録 Comparison of SiOxNy Thin Films Deposited by ECR-PECVD at 2.4 and 3.0 mTorr Total Pressure

J. Wojcik, L. Chan, W.N. Lennard, J.A. Davies, P. Mascher

Society of Vacuum Coaters
11 国際会議録 Interface state densities for SiNx:H on cleaved GaAs and InP(110)

Landheer, D., Hulse, J.E., Rajesh, K.

Materials Research Society
6 国際会議録 Oxidation of InP and Related Materials

Hussey, R.J., Sproule, G.I., McCaffrey, J.P., Driad, R., Poole, P.J., Landheer, D., Graham, M.J., SpringThorpe, A.J., …

Electrochemical Society
12 国際会議録 Interface Nanochemistry in Mg-Doped Al2O3

Petot-Ervas, Georgette, Baldinozzi, Gianguido, Petot, Claude, Graham, Mike J., Sproule, Irwin G., Tebtoub, Moussa, …

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12